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NI의 반도체 솔루션

As devices get smarter, so do our semiconductor test solutions. We know that semiconductor technology requirements outpace traditional test coverage approaches. That’s why we prioritize investments in software and systems that help you build solutions that meet your evolving needs at every step of the process.

RF Front-End Validation Solution

NI’s RF front-end validation reference architecture simplifies wideband RF power amplifier (PA) validation workflows for demanding applications such as 5G and Wi-Fi 6. The RF front-end validation reference architecture includes powerful new benefits:
- Accurate measurements with pathloss and fixture calibration using S-parameter de-embedding
- Greater understanding of PA performance through load pull with Focus Microwave tuners
- Percise output power set points every time power-sensor supported power servo (power leveling)
Use the new key features to :
- Control your PA validation bench and visualize measurement results with the integrated, cockpit-like RFIC Test Software application.
- Easily configure power, frequency, and impedance sweeps, taking advantage of built-in Focus Microwave tuner control for validating PA performance under non-50 Ω conditions.
- Run cutting-edge digital predistortion linearization algorithms and compare linearized versus nonlinearized performance with detailed graphs and results for gain, AM/AM, AM/PM, error vector magnitude (EVM), adjacent channel leakage power ratio (ACLR), PAE, and loading conditions (gamma and voltage standing wave ratio).
- Deploy extensive automated validation sequences with ease thanks to the Automation Wizard and a large collection of ready-to-run code modules and test sequences.
- Calibrate and adjust pathlosses with S2P de-embedding.
- Achieve precise output power levels with power-sensor-based output power servo.
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5G mmWave Over-the-Air Validation Reference Architecture

With NI’s fast and accurate mmWave over-the-air (OTA) validation reference architecture, you spatially can validate the latest 5G mmWave beamforming devices 5X to 10X faster—from ultraportable antenna-in-module devices to UE system-level designs. It introduces compact antenna test range capabilities in the same chamber for direct and indirect far-field (DFF and IFF) characterization. This validation reference architecture includes a thermal enclosure for validating OTA device performance over a wide temperature range from -40 °C to 85 °C.
NI’s OTA software gives you detailed 3D results and visualization of wideband 5G new radio beam characteristics, such as channel power, EVM, ACLR, SEM, and OBW. With an intuitive user experience, you can configure, run, and visualize measurement results with ease.

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Semiconductor Device Control Add-On 20.0 for InstrumentStudio

The Semiconductor Device Control Add-On for InstrumentStudio software is an add-on that helps you perform interactive register read/write operations using standard or custom digital protocols. You can save your InstrumentStudio software projects or export setups for automated validation in LabVIEW, Python, .NET, or TestStand. You can use InstrumentStudio software in parallel with automated applications to monitor and debug device control tasks in real time.
The 20.0 release adds RFFE protocol support, powerful scripting capabilities, various usability improvements, and InstrumentStudio 2020 support.

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Soliton Protocol Validation Solution for I2C, I3C, SPI, and SPMI Semiconductor Devices

The Soliton Protocol Validation Solution is an off-the-shelf validation tool that uses NI PXI digital instruments and helps chip designers perform protocol validation in as little as a few hours, significantly reducing time to market. The PXI-based validation suite helps validate the device’s compliance with timing and electrical specifications of the I2C/I3C/SPI/SPMI protocols and also can validate the device’s tolerance to and recovery from a variety of faults and exceptions, providing a comprehensive set of test reports.

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LDO Validation Solution

NI’s LDO Validation Solution combines high-performance PXI instrumentation with the Soliton LDO Measurement Suite to help you validate new LDO designs—from interactive configuration and measurements to fully automated validation. This solution includes prebuilt, configurable LDO measurements, such as line/load regulation, line/load transient, dropout voltage, and power supply rejection ratio (PSRR). You can use an intuitive InstrumentStudio software panel to interactively configure and run LDO measurements, and then you can export those measurement configurations for a simplified path to automation with either prebuilt, drag-and-drop TestStand step types or integrate LDO measurements into your own automated application with a LabVIEW programming API.

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NI Wafer-Level Reliability Software 21.0

NI’s wafer-level reliability (WLR) solutions provide a scalable, flexible, and future-proof software and hardware architecture with which you can optimize how you would gather the data required to execute your device or process qualification efforts. Through our parallelism, source measure unit (SMU) density, and performance, we can provide throughput improvements and help you gather more insights and statistics in the same amount of time, or provide you with the same amount of data in less time:
- Leverage parallel SMUs to increase your reliability data velocity between 5X and 10X with custom software
- Easily evaluate our SMU and software capabilities with our WLR examples based on LabVIEW, including:
  - Time-dependent dialectic breakdown
  - Hot carrier
  - Bias temperature instability
- Use a WLR demo box for packaged devices
- Configure, run, and review your stress tests easily within our reference examples
- Build highly synchronized and flexible systems with our SMU-per-pin system architecture and scalability
- Deploy your own custom reliability algorithms leveraging our WLR 21.0 API based on LabVIEW
- Engage more easily with customers on benchmarks
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